High Resolution Electron Microscopy 4th Edition by John CH Spence ISBN 0191508403 9780191508400

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Product details:

ISBN 10: 0191508403

ISBN 13: 9780191508400

Author: John C. H. Spence 

High-Resolution Electron Microscopy 4th Edition: This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated – these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.

 

High-Resolution Electron Microscopy 4th Edition Table of contents:

1. Preliminaries

• 1.1 Elementary principles of phase-contrast TEM imaging
• 1.2 Instrumental requirements for high resolution
• 1.3 First experiments
• References

2. Electron Optics

• 2.1 The electron wavelength and relativity
• 2.2 Simple lens properties
• 2.3 The paraxial ray equation
• 2.4 The constant-field approximation
• 2.5 Projector lenses
• 2.6 The objective lens
• 2.7 Practical lens design
• 2.8 Aberrations
• 2.9 The pre-field
• 2.10 Aberration correction
• References
• Bibliography

3. Wave Optics

• 3.1 Propagation and Fresnel diffraction
• 3.2 Lens action and the diffraction limit
• 3.3 Wave and ray aberrations (to fifth order)
• 3.4 Strong-phase and weak-phase objects
• 3.5 Diffractograms for aberration analysis
• References
• Bibliography

4. Coherence and Fourier Optics

• 4.1 Independent electrons and computed images
• 4.2 Coherent and incoherent images and the damping envelopes
• 4.3 The characterization of coherence
• 4.4 Spatial coherence using hollow-cone illumination
• 4.5 The effect of source size on coherence
• 4.6 Coherence requirements in practice
• References
• Bibliography

5. TEM Imaging of Thin Crystals and Their Defects

• 5.1 The effect of lens aberrations on simple lattice fringes
• 5.2 The effect of beam divergence on depth of field
• 5.3 Approximations for the diffracted amplitudes
• 5.4 Images of crystals with variable spacing—spinodal decomposition and modulated structures
• 5.5 Are the atom images black or white? A simple symmetry argument
• 5.6 The multislice method and the polynomial solution
• 5.7 Bloch wave methods, bound states, and ‘symmetry reduction’ of the dispersion matrix
• 5.8 Partial coherence effects in dynamical computations—beyond the product representation
• 5.9 Absorption effects
• 5.10 Dynamical forbidden reflections
• 5.11 Relationship between algorithms. Supercells, patching
• 5.12 Sign conventions
• 5.13 Image simulation, quantification, and the Stobbs factor
• 5.14 Image interpretation in germanium—a case study
• 5.15 Images of defects and nanostructures
• 5.16 Tomography at atomic resolution—imaging in three dimensions
• 5.17 Imaging bonds between atoms
• References

6. Imaging Molecules: Radiation Damage

• 6.1 Phase and amplitude contrast
• 6.2 Single atoms in bright field
• 6.3 The use of a higher accelerating voltage
• 6.4 Contrast and atomic number
• 6.5 Dark-field methods
• 6.6 Inelastic scattering
• 6.7 Noise, information, and the Rose equation
• 6.8 Single-particle cryo-electron microscopy: tomography
• 6.9 Electron crystallography of two-dimensional crystals
• 6.10 Organic crystals
• 6.11 Radiation damage: organics and low-voltage EM
• 6.12 Radiation damage: inorganics
• References

7. Image Processing, Super-Resolution, and Diffractive Imaging

• 7.1 Through-focus series, coherent detection, optimization, and error metrics
• 7.2 Tilt series, aperture synthesis
• 7.3 Off-axis electron holography
• 7.4 Imaging with aberration correction: STEM and TEM
• 7.5 Combining diffraction and image data for crystals
• 7.6 Ptychography, Ronchigrams, shadow images, in-line holography, and diffractive imaging
• 7.7 Direct inversion from dynamical diffraction patterns
• References

8. Scanning Transmission Electron Microscopy and Z-Contrast

• 8.1 Imaging modes, reciprocity, and Bragg scattering
• 8.2 Coherence functions in STEM
• 8.3 Dark-field STEM: incoherent imaging, and resolution limits
• 8.4 Multiple elastic scattering in STEM: channelling
• 8.5 Z-contrast in STEM: thermal diffuse scattering
• 8.6 Three-dimensional STEM tomography
• References

9. Electron Sources and Detectors

• 9.1 The illumination system
• 9.2 Brightness measurement
• 9.3 Biasing and high-voltage stability for thermal sources
• 9.4 Hair-pin tungsten filaments
• 9.5 Lanthanum hexaboride sources
• 9.6 Field-emission sources
• 9.7 The charged-coupled device detector
• 9.8 Image plates
• 9.9 Film
• 9.10 Direct detection cameras
• References

10. Measurement of Electron-Optical Parameters

• 10.1 Objective-lens focus increments
• 10.2 Spherical aberration constant
• 10.3 Magnification calibration
• 10.4 Chromatic aberration constant
• 10.5 Astigmatic difference: three-fold astigmatism
• 10.6 Diffractogram measurements
• 10.7 Lateral coherence width
• 10.8 Electron wavelength and camera length
• 10.9 Resolution
• 10.10 Ronchigram analysis for aberration correction
• References

11. Instabilities and the Microscope Environment

• 11.1 Magnetic fields
• 11.2 High-voltage instability
• 11.3 Vibration
• 11.4 Specimen movement
• 11.5 Contamination and the vacuum system
• 11.6 Pressure, temperature, and draughts
• References

12. Experimental Methods

• 12.1 Astigmatism correction
• 12.2 Taking the picture
• 12.3 Recording atomic-resolution images—an example
• 12.4 Adjusting the crystal orientation using non-eucentric specimen holders
• 12.5 Focusing techniques and auto-tuning
• 12.6 Substrates, sample supports, and graphene
• 12.7 Film analysis and handling for cryo-EM
• 12.8 Ancillary instrumentation for HREM
• 12.9 A checklist for high-resolution work
• References

13. Associated Techniques

• 13.1 X-ray microanalysis and ALCHEMI
• 13.2 Electron energy loss spectroscopy in STEM
• 13.3 Microdiffraction, CBED, and precession methods
• 13.4 Cathodoluminescence in STEM
• 13.5 Environmental HREM, imaging surfaces, holography of fields, and magnetic imaging with twist

 

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