ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis 1st Edition by Asm International – Ebook PDF Instant Download/Delivery: 087170823X, 9780871708236
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Product details:
ISBN 10: 087170823X
ISBN 13: 9780871708236
Author: ASM International
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
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