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Reliability of multiphysical systems set Volume 2 Nanometer scale defect detection using polarized light 1st Edition Dahoo

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Reliability of multiphysical systems set Volume 2 Nanometer scale defect detection using polarized light 1st Edition Dahoo Digital Instant Download

Author(s): Dahoo, Pierre Richard; El Hami, Abdelkhalak; Pougnet, Philippe
ISBN(s): 9781848219366, 1848219369
Edition: 1
File Details: PDF, 10.08 MB
Year: 2016
Language: english
SKU: EB-5700538 Category: Tags: , , , , ,

Reliability of multiphysical systems set Volume 2 Nanometer scale defect detection using polarized light 1st Edition Dahoo – Ebook Instant Download/Delivery ISBN(s): 9781848219366,1848219369