Advanced Tomographic Methods in Materials Research and Engineering by John Banhart ISBN 0199213240 978-0199213245

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ISBN 10: 0199213240 

ISBN 13: 978-0199213245

Author: John Banhart

 Tomography provides three-dimensional images of heterogeneous materials or engineering components, and offers an unprecedented insight into their internal structure. By using X-rays generated by synchrotrons, neutrons from nuclear reactors, or electrons provided by transmission electron microscopes, hitherto invisible structures can be revealed which are not accessible to conventional tomography based on X-ray tubes. This book provides detailed descriptions of the recent developments in this field, especially the extension of tomography to materials research and engineering. The book is grouped into four parts: a general introduction into the principles of tomography, image analysis and the interactions between radiation and matter, and one part each for synchrotron X-ray tomography, neutron tomography, and electron tomography. Within these parts, individual chapters written by different authors describe important versions of tomography, and also provide examples of applications to demonstrate the capacity of the methods.

Table of contents:

1: Introduction
2: Some Mathematical Concepts for Tomographic Reconstruction
3:Visualisation, Processing and Analysis of Tomographic Data
4: Radiation Sources and Interaction of Radiation with Matter
5: Synchrotron X-ray Absorption Tomography
6: Phase Contrast and Holographic Tomography
7: Tomography using magnifying optics
8: Scanning Tomography
9: Three-dimensional X-ray Diffraction
10: Detectors for Synchrotron Tomography
11: Fundamentals of Electron Tomography
12: Applications of Electron Tomography
13: Neutron Absorption Tomography
14: Neutron Phase Contrast and Polarised Neutron Tomography
15: Neutron Refraction and Small-Angle Scattering Tomography
Appendix A: Facilities for Tomography
Appendix B: Examples on CDROM

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