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ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis 1st Edition by Asm International 9780871707468 0871707462

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ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis 1st Edition Asm International Digital Instant Download

Author(s): ASM International
ISBN(s): 9780871707468, 0871707462
Edition: 1
File Details: PDF, 42.48 MB
Year: 2001
Language: english
SKU: EB-5307888 Category: Tag:

ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis 1st Edition by Asm International – Ebook PDF Instant Download/Delivery: 9780871707468, 0871707462

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Product details:

ISBN 10: 0871707462

ISBN 13: 9780871707468

Author: ASM International

Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories.

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