VLSI Test Principles and Architectures Design for Testability Systems on Silicon 1st Edition by Laung Terng Wang, Cheng Wen Wu, Xiaoqing Wen 9780123705976 0123705975
Original price was: $50.00.$35.00Current price is: $35.00.
VLSI Test Principles and Architectures Design for Testability Systems on Silicon 1st Edition by Laung Terng Wang, Cheng Wen Wu, Xiaoqing Wen – Ebook PDF Instant Download/Delivery: 9780123705976, 0123705975
Full download VLSI Test Principles and Architectures Design for Testability Systems on Silicon 1st Edition after payment
Product details:
ISBN 10: 0123705975
ISBN 13: 9780123705976
Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Table of contents:
Chapter 1 – Introduction
Chapter 2 – Design for Testability
Chapter 3 – Logic and Fault Simulation
Chapter 4 – Test Generation
Chapter 5 – Logic Built-In Self-Test
Chapter 6 – Test Compression
Chapter 7 – Logic Diagnosis
Chapter 8 – Memory Testing and Built-In Self-Test
Chapter 9 – Memory Diagnosis and Built-In Self-Repair
Chapter 10 – Boundary Scan and Core-Based Testing
Chapter 11 – Analog and Mixed-Signal Testing
Chapter 12 – Test Technology Trends in the Nanometer Age
People also search:
test principles in vlsi
what are the basics of vlsi
test principles in vlsi design
test principles used for testing in vlsi
what is low power vlsi design
Tags: Laung Terng Wang, Cheng Wen Wu, Xiaoqing Wen, Principles